Operates Down to 1V Dropout, 1.5V @ Max. Current.015% Line Regulation.01% Load Regulation 1% Reference Voltage Hermetic Isolated and Non-Isolated Packages Radiation Tolerant to 150 kRad (Si) Available Hi-Rel Screened, Class B and Class S, MIL-STD-883

These three terminal positive adjustable voltage regulators are designed to provide 5A, 3A, and 1.5A with higher efficiency than conventional voltage regulators. The devices are designed to operate to 1 Volt input to output differential and the dropout voltage is specified as a function of load current. All devices are pin compatible with older three terminal regulators. These devices are ideally suited for Space applications where small size, high reliability, and radiation tolerance is required. The high level of Radiation Tolerance of these devices makes them a desirable choice for LEO and many MEO and GEO communication satellites. Radiation testing is performed on a single wafer by wafer basis. Random die samples per wafer are selected, packaged and radiation tested to qualify each individual semiconductor wafer-by-wafer.

Input Voltage.30 V Operating Junction Temperature Range. + 150�C Storage Temperature. + 150�C Output Current - OMR183SC, NM.. A OMR184SC, NM.. A OMR185ST, SR, NM. A OMR186ST, SR, NM.. 0.5 A Lead Temperature (Soldering 10 seconds). 300� C Surface Mount Package Soldering Temperature. 250� C Radiation Tolerant - Total Dose, OMR183, OMR184.100k Rad (Si) Total Dose, OMR185. 50k Rad (Si) Total Dose, OMR186. 30k Rad (Si)

OMR183 and OMR184 products are packaged in the or SMD-1 Packages 5A). OMR185 products are packaged in the TO-257, D2 Pac or SMD-1 Packages (3A). OMR186 products are packaged in the TO-257, D2 Pac or TO-205 Packages & 0.5A).

Parameter Reference Voltage Conditions IOUT = 10 mA, = 25�C (VIN - VOUT) V 10mA IOUT IFULL LOAD 1.5 V (VIN - VOUT) 25 V (Note 3) Line Regulation ILOAD = 10 mA, 1.5 V (VIN - VOUT) 25�C V Min. Typ. Max. Units

15 V (VIN - VOUT) 35 V (Notes & 2) Load Regulation (VIN - VOUT) 10 mA IOUT IFULL LOAD = 25�C (Notes 2, 3) Dropout Voltage Current Limit OMR183 (VIN - VOUT) 5 V (VIN - VOUT) V OMR184 (VIN - VOUT) 5 V (VIN - VOUT) V OMR185 (VIN - VOUT) 5 V (VIN - VOUT) V OMR186 (VIN - VOUT) 5 V (VIN - VOUT) 25 V Minimum Load Current Thermal Regulation OMR185 OMR186 Ripple Rejection 120 Hz CADJ 25 �F Tantalum IOUT - IFULL LOAD (VIN - VOUT) 3 V Adjust Pin Current Adjust Pin Current Change 25�C 10mA IOUT IFULL LOAD 1.5 V (VIN - VOUT) 25 V Temperature Stability Long Term Stability Thermal Resistance TO-257, D2 Pac 125�C, 1000 Hrs. Junction-to-Case 60 (VIN - VOUT) 30 ms pulse Guaranteed by design VREF = 1%, IOUT = IFULL LOAD

Note 1: Load and line regulation are measured at a constant junction temperature by low duty cycle pulse testing. Note 2: Line and load regulation are guaranteed up to the maximum power dissipation OMR185/30W, OMR186/15W). Power dissipation is determined by the input/output differential and the output current. Guaranteed maximum power dissipation will not be available over the full input/output voltage range. Note 3: IFULL LOAD curve is defined as the minimum value of current limit as a function of input to output voltage. Note that power dissipation is only achievable over a limited range of input to output voltage. Note 4: Dropout voltage is specified over the full output current range of the device. Note 5: Refer to curves for typical characteristics versus total dose radiation levels.

Radiation Testing is performed on a single wafer by wafer basis. Each wafer is identified and a random sample of 5 die per wafer is selected. The die are then individually assembled in a hermetic package, data logged, electrically tested, hi-rel screened and then submitted to radiation testing. The packaged die are submitted to Steady State Total Dose radiation per Method 1019, Condition at a dose rate of 50 RAD/sec biased at maximum supply voltage. Final electrical test is performed within two hours of both Total Dose Radiation level from a Cobalt 60 source and 168 hr, 100�C annealing process. Read and record data including two non-radiated control samples. The wafer is then qualified only if samples from wafers meet full electrical specifications after 150% of total dose rating as specified in each product data sheet. Omnirel's controlling specifications are as follows: For Voltage Regulators the controlling specification is MIL-PRF- 38534/MIL-STD-883. For Rectifiers/Schottky the controlling specification is MIL-PRF-19500/MIL-STD-750.

Wafer Lot Acceptance Non-destructive Bond Pull Pre-Cap Visual Inspection Temperature Cycle Constant Acceleration Visual Inspection PIND Test Serialization Pre-Burn-In Electrical Burn-In Interim Electrical PDA Calculations Final Electrical Fine & Gross Seal Radiographic Conformance Inspection** Final Visual Inspection 1010 2001 ------------Data Sheet 1015/160 hrs. ----5% Functional Data Sheet 1014 ----GR A 2009

*Note: For "B" Level Screening add "M" to part number, for "S" Level Screening add "S" to part number. See Part Number Designator. **Note: Additional conformance inspection testing i.e. Group & D optional.