Part | AT22LV10-25JI |
Category | FPGAs/PLDs => PLDs (Programmable Logic Devices) => Ultraviolet Erasable PLD |
Title | UV SPLD |
Description | Low-voltage uv Erasable Programmable Logic Device |
Company | ATMEL Corporation |
Datasheet | Download AT22LV10-25JI Datasheet |
Quote |
Features, Applications |
Features � Wide Power Supply Range 5.5V � Ideal for Battery Powered Systems High-speed Operation 20 ns Maximum Propagation Delay at VCC = 3.0V Commercial and Industrial Temperature Ranges Familiar 22V10 Logic Architecture Low-power 3-volt CMOS Operation AT22LV10L Temp ICC (mA) Com./Ind. 4/5 AT22LV10 Com./Ind. 35/45 VCC = 3.6V Reprogrammable � Tested 100% for Programmability High-reliability CMOS Technology� 2000V ESD Protection 200 mA Latchup Immunity Dual-in-line and Surface Mount Packages Description The AT22LV10 and AT22LV10L are low-voltage compatible CMOS high-performance Programmable Logic Devices (PLDs). Speeds down 20 ns and power dissipation as low 14.4 mW are offered. All speed ranges are specified over the to 5.5V range. All pins offer a low �10 �A leakage. The AT22LV10L provides the optimum low-power CMOS PLD solution, with low DC power (1 mA typical = 3.3V) and full CMOS output levels. The AT22LV10L significantly reduces total system power, allowing battery powered operation. (continued) Pin Name CLK/IN IN I/O * VCC Function Clock and Logic Input Logic Inputs Bidirectional Buffers No Internal Connection to 5.5V Supply Full CMOS output levels help reduce power in many other system components. The AT22LV10 and AT22LV10L logic architectures are identical to the familiar 22V10. Each output is allocated from eight to 16 product terms, which allows highly complex logic functions to be realized. Two additional product terms are included to provide synchronous preset and asynchronous reset. These terms are common to all ten registers. All registers are automatically cleared upon power-up. Register preload simplifies testing. A security fuse prevents unauthorized copying of programmed fuse patterns. Temperature Under Bias................................ to +125�C Storage Temperature..................................... to +150�C Voltage on Any Pin with Respect +7.0V (1) Voltage on Input Pins with Respect to Ground During +14.0V (1) Programming Voltage with Respect +14.0V (1) Integrated UV Erase Dose..............................7258 Wsec/cm2 *NOTICE: Stresses beyond those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions beyond those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. 1. Minimum voltage -0.6V DC which may undershoot to -2.0V for pulses of less than 20 ns. Maximum pin voltage is VCC 0.75V DC which may undershoot to VCC + 2.0V for pulses of less than 20 ns. Commercial Operating Temperature (Ambient) VCC Power Supply to 5.5V Industrial to 5.5VSymbol ILI ILO Parameter Input Load Current Output Leakage Current Condition(2) VIN -0.1V to VCC + 1V VOUT -0.1V to VCC + 0.1V Com. ICC Power Supply Current VCC = 3.6V/5.5V, VIN = GND, Outputs Open AT22LV10 Ind. Com. AT22LV10L Ind. VIL1 VIL2 VIH Output Short Circuit Current Input Low Voltage Input Low Voltage Input High Voltage VCC = 3.0V VOL Output Low Voltage VIN = VIH or VIL VCC = 4.5V VCC = 3.0V VOH Notes: Output High Voltage VIN = VIH or VIL, VCC = 3.0V/4.5V Com., Ind. Com., Ind. Com., Ind. IOH -100 �A IOL 8 mA IOL 16 mA IOL 6 mA VCC - 0.3 VOUT 0.5V 4.5V VCC 5.5V 3.0V VCC < 4.5V VCC mA 20/50 Min Typ Max 10 35/90 Units �A mA IOH 2.4 1. Not more than one output at a time should be shorted. Duration of short circuit test should not exceed 30 sec. 2. For DC characteristics, the test condition of VCC = Max corresponds to 3.6V. |
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