10N100U1 datasheet - Low Vce(sat) High Speed Igbt With Diode

Details, datasheet, quote on part number: 10N100U1
Part10N100U1
CategoryDiscrete => IGBTs (Insulated Gate Bipolar Transistors)
TitleMedium Voltage 600-1199 Volts
DescriptionLow Vce(sat) High Speed Igbt With Diode
CompanyIXYS Corporation
DatasheetDownload 10N100U1 Datasheet
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Features, Applications
VCES Low VCE(sat) IGBT with Diode High speed IGBT with Diode IXGH 10 N100U1 IXGH 1000 V

Test Conditions to 150 �C; RGE 1 M Continuous Transient 1 ms VGE 15 V, TVJ = 150 Clamped inductive load, = 25�C

Features
Maximum lead temperature for soldering mm (0.062 in.) from case for 10 s

International standard package JEDEC TO-247 AD IGBT and anti-parallel FRED in one package 2nd generation HDMOS TM process Low VCE(sat) - for low on-state conduction losses MOS Gate turn-on - drive simplicity Fast Recovery Epitaxial Diode (FRED) - soft recovery with low IRM

Applications Symbol Test Conditions Characteristic Values (TJ = 25�C, unless otherwise specified) min. typ. max. nA V

AC motor speed control DC servo and robot drives DC choppers Uninterruptible power supplies (UPS) Switch-mode and resonant-mode power supplies

Space savings (two devices in one package) Easy to mount with 1 screw (isolated mounting screw hole) Reduces assembly time and cost

Symbol Test Conditions Characteristic Values (TJ = 25�C, unless otherwise specified) min. typ. max. 8 750 VCE 25 V, VGE = 1 MHz = IC90, VGE 15 V, VCE = 0.5 VCES Inductive load, = IC90, VGE � H, VCE 0.8 V CES, RG = Roff = 150 Remarks: Switching times may increase for VCE (Clamp) > 0.8 VCES , higher TJ or increased RG Inductive load, = IC90, VGE � H VCE 0.8 V CES, RG = Roff = 150 Remarks: Switching times may increase for VCE (Clamp) > 0.8 VCES , higher TJ or increased mJ 1.2 K/W 0.25 K/W

gfs Cies Coes Cres Qg Qge Qgc td(on) tri td(off) tfi Eoff td(on) tri Eon td(off) tfi Eoff RthJC RthCK

Reverse Diode (FRED) Symbol I RM trr RthJC Test Conditions
Characteristic Values (TJ = 25�C, unless otherwise specified) min. typ. max. A ns

= IC90, VGE 0 V, Pulse test, t 300 �s, duty cycle = IC90, VGE 0 V, -diF /dt = 100 A/�s 1 A; -di/dt = 50 A/�s; 25 �C

IXYS reserves the right to change limits, test conditions, and dimensions.
IXYS MOSFETS and IGBTs are covered by one or more of the following U.S. patents:
Fig. 4 Temperature Dependence of Output Saturation Voltage
Fig. 6 Temperature Dependence of Breakdown and Threshold Voltage

 

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