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OR2C12A-5PS84 Datasheet(PDF) 56 Page - List of Unclassifed Manufacturers |
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OR2C12A-5PS84 Datasheet(HTML) 56 Page - List of Unclassifed Manufacturers |
56 / 192 page Data Sheet ORCA Series 2 FPGAs June 1999 56 Lucent Technologies Inc. Special Function Blocks (continued) There are four ORCA-defined instructions. The PLC scan rings 1 and 2 (PSR1, PSR2) allow user-defined internal scan paths using the PLC latches/FFs. The RAM_Write Enable (RAM_W) instruction allows the user to serially configure the FPGA through TDI. The RAM_Read Enable (RAM_R) allows the user to read back RAM contents on TDO after configuration. ORCA Boundary-Scan Circuitry The ORCA Series boundary-scan circuitry includes a test access port controller (TAPC), instruction register (IR), boundary-scan register (BSR), and bypass regis- ter. It also includes circuitry to support the four pre- defined instructions. Figure 49 shows a functional diagram of the boundary- scan circuitry that is implemented in the ORCA series. The input pins’ (TMS, TCK, and TDI) locations vary depending on the part, and the output pin is the dedi- cated TDO/RD_DATA output pad. Test data in (TDI) is the serial input data. Test mode select (TMS) controls the boundary-scan test access port controller (TAPC). Test clock (TCK) is the test clock on the board. The BSR is a series connection of boundary-scan cells (BSCs) around the periphery of the IC. Each I/O pad on the FPGA, except for CCLK, DONE, and the boundary- scan pins (TCK, TDI, TMS, and TDO), is included in the BSR. The first BSC in the BSR (connected to TDI) is located in the first PIC I/O pad on the left of the top side of the FPGA (PTA PIC). The BSR proceeds clock- wise around the top, right, bottom, and left sides of the array. The last BSC in the BSR (connected to TDO) is located on the top of the left side of the array (PLA3). The bypass instruction uses a single FF which resyn- chronizes test data that is not part of the current scan operation. In a bypass instruction, test data received on TDI is shifted out of the bypass register to TDO. Since the BSR (which requires a two FF delay for each pad) is bypassed, test throughput is increased when devices that are not part of a test operation are bypassed. The boundary-scan logic is enabled before and during configuration. After configuration, a configuration option determines whether or not boundary-scan logic is used. The 32-bit boundary-scan identification register con- tains the manufacturer’s ID number, unique part num- ber, and version, but is not implemented in the ORCA series of FPGAs. If boundary scan is not used, TMS, TDI, and TCK become user I/Os, and TDO is 3-stated or used in the readback operation. 5-2840(C).r7 Figure 49. ORCA Series Boundary-Scan Circuitry Functional Diagram TAP CONTROLLER BOUNDARY-SCAN REGISTER PSR2 REGISTER (PLCs) BYPASS REGISTER DATA MUX INSTRUCTION DECODER INSTRUCTION REGISTER M U X RESET CLOCK-IR SHIFT-IR UPDATE-IR PUR TDO SELECT ENABLE RESET CLOCK-DR SHIFT-DR UPDATE-DR TDI DATA REGISTERS PSR1 REGISTER (PLCs) CONFIGURATION REGISTER (RAM_R, RAM_W) I/O BUFFERS VDD TMS VDD TCK VDD PRGM VDD |
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