Part | IDT54FCT138ATE |
Category | Logic => Decoder/Demultiplexers |
Title | CMOS/BiCMOS->FCT/FCT-T Family |
Description | Fast CMOS 1-of-8 Decoder With Enable |
Company | Integrated Device Technology, Inc. |
Datasheet | Download IDT54FCT138ATE Datasheet |
Quote |
Features, Applications |
Std., A, and C grades Low input and output leakage 1�A (max.) CMOS power levels True TTL input and output compatibility: � VOH = 3.3V (typ.) � VOL = 0.3V (typ.) High Drive outputs (-15mA IOH, 48mA IOL) Meets or exceeds JEDEC standard 18 specifications Military product compliant to MIL-STD-883, Class B and DESC listed (dual marked) Power off disable outputs permit "live insertion" Available in the following packages: � Industrial: SOIC, QSOP � Military: CERDIP, LCC The a 1-of-8 decoder built using an advanced dual metal CMOS technology. The IDT54/74FCT138T accepts three binary weighted inputs A1, A2) and, when enabled, provides eight mutually exclusive active low outputs - O7). The IDT54/74FCT138T features three enable inputs, two active low (E1, E2) and one active high (E3). All outputs will be high unless E1 and E2 are low and E3 is high. This multiple enable function allows easy parallel expansion of the device 1-of-32 (5 lines to 32 lines) decoder with just four IDT54/74FCT138T devices and one inverter. The IDT logo is a registered trademark of Integrated Device Technology, Inc.Symbol Description Max to +120 Unit mA VTERM(2) Terminal Voltage with Respect to GND VTERM(3) Terminal Voltage with Respect to GND TSTG IOUT Storage Temperature DC Output Current Pin Names - O7 Address Inputs Enable Inputs (Active LOW) Enable Input (Active HIGH) Outputs (Active LOW) Description NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by =0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only. Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF NOTE: 1. This parameter is measured at characterization but not tested.NOTE: H = HIGH Voltage Level X = Don't Care L = LOW Voltage Level Following Conditions Apply Unless Otherwise Specified: Industrial: to +85�C, VCC 5.0V �10%; Military: to +125�C, VCC 5.0V �10% Symbol VIH VIL IIH IIL II VIK IOS VOH Parameter Input HIGH Level Input LOW Level Input HIGH Current(4) Input LOW Current(4) Input HIGH Current(4) Clamp Diode Voltage Short Circuit Current Output HIGH Voltage Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max., VI = VCC (Max.) VCC = Min., IIN = �18mA VCC = Max., VO = VCC = Min VIN = VIH or VIL GND(3) IOH = �6mA MIL IOH = �8mA IND IOH = �12mA MIL IOH = �15mA IND IOL = �32mA MIL IOL = �48mA IND VCC = Max. VIN = GND or VCC = 0.5V Min. Typ.(2) Max. mA V Unit V �A Output LOW Voltage Input Hysteresis Quiescent Power Supply CurrentNOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC 5.0V, +25�C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter = �55�C. |
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